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3D Simulation of SEU in SiGe HBTS and Radiation Hardening by Design
(2010-07-27)
This thesis presents 3-D simulation of Single Event Upset (SEU) in IBM 5HP and 8HP heterojunction bipolar transistors (HBT). SiGe HBT has been attractive for space applications because
of its high performance. SiGe HBTs ...