Dictionary-Less Defect Diagnosis as Real or Surrogate Single Stuck-At Faults

Abstract

In this work, an algorithm to diagnose classic single stuck-at-faults and provide surrogate fault suspects for non-classical faults like multiple faults by analyzing failing circuits is proposed. The algorithm is based on effect-cause analysis and is less complex than existing methods. This diagnostic procedure involves adding or removing faults from a set of suspected faults based on the observed circuit outputs and minimal fault simulation to finally obtain a small set of candidate faults. The proposed procedure was evaluated by conducting experiments on benchmark circuits and was found to be effective.