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Browsing by Author "Agrawal, Vishwani D."
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Soft Error Rate Determination For Nanometer CMOS VLSI Circuits
Wang, Fan (2008-05-15)
Nanometer CMOS VLSI circuits are highly sensitive to soft errors due to envi-
ronmental causes such as cosmic radiation and high-energy particles. These errors are
random and not related to permanent hardware faults. ...
Spectral Methods for Testing of Digital Circuits
Yogi, Nitin (2009-06-23)
Due to increasing design complexities of digital circuits in recent years, a growing problem in Very Large Scale Integrated (VLSI) digital circuit testing is the exponential rise in the test generation complexity and an ...
Test time optimization in scan circuits
Shanmugasundaram, Priyadharshini (2010-11-10)
As circuit sizes increase with scale down in technology, the time required to test the circuits also increases. Expensive automatic test equipment (ATE) is used to test these circuits and the cost of testing becomes a ...