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Browsing by Author "Singh, Adit"

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Resource and Service Management for Fog Infrastructure as a Service 

Shaik, Shehenaz (2019-07-30)  ETD File Embargoed
Cloud computing stops short in its offerings towards deployment of latency-critical and bandwidth-intensive applications. Fog computing is emerging as complementary to cloud computing in realizing the deployment of large-scale ...

RF Linearity Analysis In Nano Scale CMOS Using Harmonic Balance Device Simulations 

Kopalle, Deepika (2005-12-15)
In this thesis, Intermodulation Linearity characteristics of CMOS have been analyzed using power series and Harmonic Balance(HB) Method. Harmonic Bal- ance method is a frequency domain steady state analysis method used ...

Simulation Based Power Estimation For Digital CMOS Technologies 

Alexander, Jins (2008-12-15)
The estimation of power in digital CMOS circuits has become a significant problem, especially for present day semiconductor technologies. Finding a balance between opposing factors of estimation accuracy and computation ...

Spectral Methods for Testing of Digital Circuits 

Yogi, Nitin (2009-06-23)
Due to increasing design complexities of digital circuits in recent years, a growing problem in Very Large Scale Integrated (VLSI) digital circuit testing is the exponential rise in the test generation complexity and an ...

Strategies for Efficient and Effective Scan Delay Testing 

Han, Chao (2011-04-27)
Aggressive timing requirements in today’s high-speed designs have introduced the need to test for small delay defects and distributed timing faults caused by statistical process variations. Faster-than-rated clock delay ...

Testing and Diagnosis of CMOS Open Defects in the Presence of Common Hazards 

Han, Chao (2015-07-29)
CMOS open defects are breaks in wires or defective transistors within some library cell causing pull up or pull down failure of the defective gates. Traditionally, TSOF (transistor stuck-open fault) is used to model such ...

Towards Unclonable System Design for Resource-Constrained Application 

Mahmod, Md Jubayer al (2019-07-01)
As we forge ahead to achieve the targeted connectivity among devices in this Internet of Things (IoT) era, reliability and security of individual device have become a matter of paramount importance. Cloned electronic ...