This Is AuburnElectronic Theses and Dissertations
  1. AUETD Home
  2. Browsing by Author

Browsing by Author "Stroud, Charles"

Now showing items 21-26 of 26

Minimizing N-Detect Tests for Combinational Circuits 

Kantipudi, Kalyana (2007-05-15)
An N-detect test set detects each stuck-at fault by at least N different vectors. N-detect tests are of practical interest because of their ability to improve the defect coverage. The main problem that limits their use is ...

Power and Performance Optimization of Static CMOS Circuits with Process Variation 

Lu, Yuanlin (2007-08-15)
With the continuing trend of technology scaling, leakage power has become a main contributor to power consumption. Dual threshold (dual-Vth) assignment has emerged as an efficient technique for decreasing leakage power. ...

Radio Frequency Integrated Circuits for Wireless and Wireline Communications 

Kakani, Vasanth (2007-12-15)
This dissertation presents my studies in design of high frequency circuits for wireless and wireline communication systems. As a part of this effort a seven tap transversal filter has been designed using broadband amplifiers. ...

Reconvergent Fanout Analysis of Bounded Gate Delay Faults 

Grimes, Hillary (2008-08-15)
To determine the quality that a set of gate delay tests provides for testing gate delay faults, gate delay fault simulation must determine the minimum size detectable for detected gate delay faults. The minimum size ...

Selective Spectrum Analysis and Numerically Controlled Oscillator in Mixed-Signal Built-In Self-Test 

Qin, Jie (2010-12-09)
Built-In Self-Test (BIST) offers a system the ability to test itself. Though it introduces inevitable extra cost for the added hardware, it also makes it possible to monitor, measure and calibrate the system on the fly ...

Spectral Methods for Testing of Digital Circuits 

Yogi, Nitin (2009-06-23)
Due to increasing design complexities of digital circuits in recent years, a growing problem in Very Large Scale Integrated (VLSI) digital circuit testing is the exponential rise in the test generation complexity and an ...