Browsing by Author "Han, Chao"

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Strategies for Efficient and Effective Scan Delay Testing

Han, Chao (2011-04-27)

Aggressive timing requirements in today’s high-speed designs have introduced the need to test for small delay defects and distributed timing faults caused by statistical process variations. Faster-than-rated clock delay ...

Testing and Diagnosis of CMOS Open Defects in the Presence of Common Hazards

Han, Chao (2015-07-29)

CMOS open defects are breaks in wires or defective transistors within some library cell causing pull up or pull down failure of the defective gates. Traditionally, TSOF (transistor stuck-open fault) is used to model such ...