Browsing by Author "Masoud, Mahjouri-Samani"

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On-wafer RF Characterization and Modeling of Noise, Linearity and Reliability of Advanced RF FinFETs

Ding, Xuewei (2024-04-30) ETD File Embargoed

This work investigates the RF characterization and modeling of noise, linearity, and reliability of advanced RF FinFETs. 5-nm technology devices are used in linearity and noise modeling, and 14-nm technology devices are ...

RF Characterization and Modeling of 14nm RF FinFETs

Zhang, Jiabi (2019-12-04) ETD File Embargoed

This work focuses on the characterization and compact modeling of RF characteristics of both n- and p-channel transistors fabricated using 14-nm FinFET technologies. DC I-V, as well as its higher order derivatives, C-V, ...