Browsing by Author "Venkatasubramanian, Muralidharan"

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Energy Efficiency and Process Variation Tolerance of 45 nm Bulk and High-k CMOS Devices

Venkatasubramanian, Muralidharan (2011-04-18)

With transistor sizes being reduced to sub 45nm ranges, we have seen an improvement in speed, better performance, and deeper integration of digital circuits. However, there has been a corresponding increase in power ...

Failure Evasion: Statistically Solving the NP Complete Problem of Testing Difficult-to-Detect Faults

Venkatasubramanian, Muralidharan (2016-12-08)

A circuit with n primary inputs (PIs) has N = 2n possible input vectors. A test vector to correctly detect a fault in that circuit must be among those 2n n-bit combinations. Clearly, this problem can be rephrased as a ...