Dictionary-Less Defect Diagnosis as Real or Surrogate Single Stuck-At Faults
Metadata Field | Value | Language |
---|---|---|
dc.contributor.advisor | Agrawal, Vishwani D. | |
dc.contributor.author | Alagappan, Chidambaram | |
dc.date.accessioned | 2013-04-05T20:30:09Z | |
dc.date.available | 2013-04-05T20:30:09Z | |
dc.date.issued | 2013-04-05 | |
dc.identifier.uri | http://hdl.handle.net/10415/3514 | |
dc.description.abstract | In this work, an algorithm to diagnose classic single stuck-at-faults and provide surrogate fault suspects for non-classical faults like multiple faults by analyzing failing circuits is proposed. The algorithm is based on effect-cause analysis and is less complex than existing methods. This diagnostic procedure involves adding or removing faults from a set of suspected faults based on the observed circuit outputs and minimal fault simulation to finally obtain a small set of candidate faults. The proposed procedure was evaluated by conducting experiments on benchmark circuits and was found to be effective. | en_US |
dc.rights | EMBARGO_NOT_AUBURN | en_US |
dc.subject | Electrical Engineering | en_US |
dc.title | Dictionary-Less Defect Diagnosis as Real or Surrogate Single Stuck-At Faults | en_US |
dc.type | thesis | en_US |
dc.embargo.length | NO_RESTRICTION | en_US |
dc.embargo.status | NOT_EMBARGOED | en_US |