This Is AuburnElectronic Theses and Dissertations

Browsing Auburn Theses and Dissertations by Author "Kantipudi, Kalyana"

Now showing items 1-1 of 1

Minimizing N-Detect Tests for Combinational Circuits 

Kantipudi, Kalyana (2007-05-15)
An N-detect test set detects each stuck-at fault by at least N different vectors. N-detect tests are of practical interest because of their ability to improve the defect coverage. The main problem that limits their use is ...