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Browsing Auburn Theses and Dissertations by Author "Xu, Gefu"

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Delay Test Scan Flip-flop (DTSFF) Design and Its Applications for Scan Based Delay Testing 

Xu, Gefu (2007-12-15)
Scan based delay testing is currently mostly implemented using launch-on-capture (LOC) delay tests. Launch-on-shift (LOS) tests are generally more effective, achieving higher fault coverage with significantly fewer test ...