Analysis and Implementation of Built-In Self-Test for Block Random Access Memories in Virtex-5 Field Programmable Gate Arrays
Metadata Field | Value | Language |
---|---|---|
dc.contributor.advisor | Stroud, Charles | |
dc.contributor.advisor | Nelson, Victor | |
dc.contributor.advisor | Wu, Chwan-Hwa | |
dc.contributor.author | Dailey, Justin | |
dc.date.accessioned | 2011-07-18T16:02:05Z | |
dc.date.available | 2011-07-18T16:02:05Z | |
dc.date.issued | 2011-07-18 | |
dc.identifier.uri | http://hdl.handle.net/10415/2674 | |
dc.description.abstract | In order to ensure the proper operation of the embedded Block Random Access Memories (BRAMs) in Xilinx Virtex-5 Field-Programmable Gate Arrays (FPGAs) a dependable and resource efficient test is needed so that the integrity of the memory can be guaranteed in a timely manner. The approach that is described in this thesis is based on a Built-In Self-Test (BIST) approach initially proposed by Garimella for Xilinx Virtex-1 and Virtex-2 FPGAs. It was later expanded upon by Milton for Xilinx Virtex-4 FPGAs. The work was continued by Garrison for Virtex-4 in order to improve BIST generation and execution time. Garrison also proposed a design for BRAM BIST for Virtex-5 FPGAs. Garrison’s proposal for Virtex-5 FPGAs is expanded upon and implemented in this thesis. | en_US |
dc.rights | EMBARGO_NOT_AUBURN | en_US |
dc.subject | Electrical Engineering | en_US |
dc.title | Analysis and Implementation of Built-In Self-Test for Block Random Access Memories in Virtex-5 Field Programmable Gate Arrays | en_US |
dc.type | thesis | en_US |
dc.embargo.length | NO_RESTRICTION | en_US |
dc.embargo.status | NOT_EMBARGOED | en_US |